| dc.contributor.author | Öksüzoğlu, Ramis Mustafa | |
| dc.date.accessioned | 2019-10-22T16:58:42Z | |
| dc.date.available | 2019-10-22T16:58:42Z | |
| dc.date.issued | 2009 | |
| dc.identifier.issn | 2053-2733 | |
| dc.identifier.uri | https://dx.doi.org/10.1107/S0108767309098754 | |
| dc.identifier.uri | https://hdl.handle.net/11421/21574 | |
| dc.description | WOS: 000480362900125 | en_US |
| dc.description.abstract | … | en_US |
| dc.language.iso | eng | en_US |
| dc.publisher | Int Union Crystallography | en_US |
| dc.relation.isversionof | 10.1107/S0108767309098754 | en_US |
| dc.rights | info:eu-repo/semantics/openAccess | en_US |
| dc.subject | X-Ray Reflectivity | en_US |
| dc.subject | Atomic Force Microcopy | en_US |
| dc.subject | Resistivity | en_US |
| dc.subject | Metal Oxide Thin Films | en_US |
| dc.subject | Sensors | en_US |
| dc.title | Surface and Interface Study of Vanadium Oxide Nano Films | en_US |
| dc.type | conferenceObject | en_US |
| dc.relation.journal | Acta Crystallographica A-Foundation and Advances | en_US |
| dc.contributor.department | Anadolu Üniversitesi, Mühendislik Fakültesi, Malzeme Bilimi ve Mühendisliği Bölümü | en_US |
| dc.identifier.volume | 65 | en_US |
| dc.identifier.startpage | S64 | en_US |
| dc.identifier.endpage | S64 | en_US |
| dc.relation.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | en_US |
| dc.contributor.institutionauthor | Öksüzoğlu, Ramis Mustafa | |
