Interphase boundaries between hexagonal boron nitride and beta silicon nitride in silicon nitride-silicon carbide particulate composites

Abstract

Inter phase boundaries between hexagonal boron nitride and Q-Si3N4 in hot isostatically pressed Si3N4-SiC particulate composites, in which boron nitride appears as a trace contaminant, have been examined using high resolution transmission electron microscopy. A number of characteristic orientation relationships were observed between these two phases. Significantly, high resolution transmission electron microscopy showed that the interphase boundaries tended not to contain any intergranular films