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dc.contributor.authorKnowles, KM
dc.contributor.authorTuran, Servet
dc.date.accessioned2019-10-19T21:04:16Z
dc.date.available2019-10-19T21:04:16Z
dc.date.issued2000
dc.identifier.issn0304-3991
dc.identifier.urihttps://dx.doi.org/10.1016/S0304-3991(00)00018-8
dc.identifier.urihttps://hdl.handle.net/11421/15779
dc.descriptionWOS: 000087227000009en_US
dc.descriptionPubMed ID: 10841337en_US
dc.description.abstractHigh-resolution transmission electron microscope observations of hexagonal boron nitride - 3C silicon carbide interphase boundaries suggest that where one or more phases is highly anisotropic, an orientation dependence on equilibrium film thickness can arise. Theoretical considerations of this phenomenon in terms of the equilibrium thickness of an amorphous film between two crystalline media are consistent with the trend seen experimentallyen_US
dc.language.isoengen_US
dc.publisherElsevier Science BVen_US
dc.relation.isversionof10.1016/S0304-3991(00)00018-8en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectHigh-Resolution Transmission Electron Microscopy (Hrtem)en_US
dc.subjectInterfacesen_US
dc.subjectCeramicsen_US
dc.subjectThin Filmsen_US
dc.subjectDispersion Forcesen_US
dc.subjectHamaker Constanten_US
dc.titleThe dependence of equilibrium film thickness on grain orientation at interphase boundaries in ceramic-ceramic compositesen_US
dc.typearticleen_US
dc.relation.journalUltramicroscopyen_US
dc.contributor.departmentAnadolu Üniversitesi, Fen Bilimleri Enstitüsü, Seramik Mühendisliği Anabilim Dalıen_US
dc.identifier.volume83en_US
dc.identifier.issue3.Nisen_US
dc.identifier.startpage245en_US
dc.identifier.endpage259en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US]
dc.contributor.institutionauthorTuran, Servet


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