Yazar "Finstad, T. G." için listeleme
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Evolution of Vibrational Modes of SiO2 During the Formation of Ge and Si Nanocrystals by Ion Implantation and Magnetron Sputtering
Imer, A. Gençer; Yerci, S.; AlagÖz, A. S.; Kulakçı, M.; Serincan, Uğur; Finstad, T. G.; Turan, R. (Amer Scientific Publishers, 2010)Structural variations of SiOx matrix have been studied with Fourier Transform Infrared Spectroscopy (FTIR) during the formation of Si and Ge nanocrystal. Two frequently used methods, magnetron sputtering and ion implantation ... -
Variation of photoluminescence from Si nanostructures in SiO2 matrix with Si+ post implantation
Serincan, Uğur; Kulakçı, M.; Turan, Raşit; Foss, S.; Finstad, T. G. (2007)Si nanoclusters were formed by 28Si ion implantation into SiO2 matrix and subsequently annealed at 1050 °C for 2 h under N2 ambient. The photoluminescence (PL) characteristics depend on the 28Si fluence. The PL signals ...
