Yazar "Ortner, H. M." için listeleme
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Determination of thickness, density and roughness of Co-Ni-Al single and multiple layer films deposited by high-vacuum e-beam evaporation on different substrates
Baake, O.; Öksüzoğlu, Ramis Mustafa; Flege, S.; Hoffmann, P. S.; Gottschalk, S.; Fuess, H.; Ortner, H. M. (2006)Thickness, density, surface and interface roughness of Al-Co-Ni single and multiple layer films deposited by high-vacuum e-beam evaporation on different substrates were investigated using X-ray reflectivity (XRR). The ...
