Yazar "Yıldırım, M." için listeleme
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Characterization of microstructural and morphological properties in as-deposited Ta/NiFe/IrMn/CoFe/Ta multilayer system
Öksüzoğlu, Ramis Mustafa; Sarac, U.; Yıldırım, M.; Çınar, H. (Chinese Society of Metals, 2014)Surface morphology and its relationship with microstructure in Ta/NiFe/IrMn/CoFe/Ta multilayer system deposited by pulsed DC magnetron sputtering have been investigated in dependence of Ta buffer and NiFe seed layer ... -
Ferromagnetic resonance and X-ray reflectivity studies of pulsed DC magnetron sputtered NiFe/IrMn/CoFe exchange bias
Ferromagnetic resonance and X-ray specular reflectivity measurements were performed on Ni81Fe19/Ir20Mn80/ Co90Fe10 exchange bias trilayers, which were grown using the pulsed-DC magnetron sputtering technique on Si(100)/SiO2(1000 ... -
Influence of post-annealing on electrical, structural and optical properties of vanadium oxide thin films
Vanadium oxide thin films were grown onto quartz substrates using the pulsed DC reactive magnetron sputtering technique at room temperature and afterwards post annealed under vacuum conditions in the temperature range from ... -
Interface roughness and exchange bias - Coercivity ratio in Pulsed-DC magnetron sputtered NiFe/IrMn/CoFe exchange bias trilayers
Ta/Ru/Ta/Ni81Fe19/Ir20Mn 80/Co90Fe10 exchange bias multilayer was grown by using pulsed DC unbalanced magnetron sputtering technique. The deposition pulse frequency of the NiFe seed layer has been varied between 10 - 50 ...
