Yazar "Yerci, S." için listeleme
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Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation
Yerci, S.; Yıldız, I.; Kulakcı, Mustafa; Serincan, Uğur; Barozzi, M.; Bersani, M.; Turan, R. (Amer Inst Physics, 2007)Depth profiles of Si nanocrystals formed in sapphire by ion implantation and the effect of charging during X-ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectrometry (SIMS) measurements have been studied. ... -
Evolution of Vibrational Modes of SiO2 During the Formation of Ge and Si Nanocrystals by Ion Implantation and Magnetron Sputtering
Imer, A. Gençer; Yerci, S.; AlagÖz, A. S.; Kulakçı, M.; Serincan, Uğur; Finstad, T. G.; Turan, R. (Amer Scientific Publishers, 2010)Structural variations of SiOx matrix have been studied with Fourier Transform Infrared Spectroscopy (FTIR) during the formation of Si and Ge nanocrystal. Two frequently used methods, magnetron sputtering and ion implantation ... -
Structural and optical properties of Al2O3 with Si and Ge nanocrystals
Yerci, S.; Yıldız, I.; Seyhan, A.; Kulakçı, M.; Serincan, Uğur; Shandalov, M.; Turan, R. (2007)Si and Ge nanocrystals were formed in Al2O3 matrix by ion implantation and subsequent annealing. The phase separation of the Si nanocrystals was observed using X-ray photoelectron spectroscopy by monitoring Si 2p electrons. ...
