Yazar "Turan, Servet" için WoS İndeksli Yayınlar Koleksiyonu listeleme
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Transmission electron microscopy of SrO containing multi-cation doped alpha-SiAlON ceramics
Turan, Servet; Mandal, Hasan; Kara, Ferhat (Trans Tech Publications LTD, 2002)An advantage of alpha-SiAlON is that it can accommodate cations of sintering additives and hence reduces the amount of deleterious remnant intergranular amorphous phase. However, it is believed that relatively large cations ... -
Transmission electron microscopy studies of La2O3-doped alpha-SiAlON ceramics
Turan, Servet; Mandal, Hasan; Kara, Ferhat; Knowles, KM (IOP Publishing LTD, 1999)alpha-SiAlON is able to accommodate cations into its crystal structure if the cations are sufficiently small in size, thus helping to reduce the volume of the remnant grain boundary phase after processing. In this study, ... -
Utilizing Scanning Electron Microscopy Stereoscopy to Explain the Wear Behavior of Latch Needles
Cukul, Dilek; Candan, Cevza; Turan, Servet (SAGE Publications LTD, 2010)Knitting needles are the main elements for the knitting process and they are continuously in contact with fibers, yarns and contaminants existing in the structure of the yarns. In this study, the wear occurring inside latch ... -
The Valance Determination of Cerium Ions in alpha-SiAlON by Electron Energy Loss Spectroscopy Analysis
Yurdakul, Hilmi; Turan, Servet (Cambridge University Press, 2008)… -
Wear behavior of solid SiAlON milling tools during high speed milling of Inconel 718
Çelik, Ali; Alagac, Melike Sert; Turan, Servet; Kara, Alpagut; Kara, Ferhat (Elsevier Science Sa, 2017)Machining of Inconel 718 is a challenging process because of high hot strength and hardness, high reactivity with the tool materials and low thermal conductivity of Inconel 718 alloy. Although SiAION ceramics in the form ... -
Wetting and non-wetting behaviour of silicon carbide grain boundaries
Turan, Servet; Knowles, K. M. (Transtec Publications LTD, 1999)Silicon carbide (SiC) grain boundaries have been observed to be free from intergranular films. On the basis of equilibrium film thickness calculations, it has been proposed elsewhere that because SiC has very high refractive ...