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dc.contributor.authorTıraş, Engin
dc.date.accessioned2019-10-20T09:30:59Z
dc.date.available2019-10-20T09:30:59Z
dc.date.issued2012
dc.identifier.issn1454-4164
dc.identifier.urihttps://hdl.handle.net/11421/17548
dc.description.abstractThe electron effective mass in AlGaN/AlN/GaN heterostructure grown by the metalorganic chemical vapor deposition (MOCVD) technique was determined from the phonon-plasmon coupled-mode line-shape analysis of vibrational spectroscopy measurements. The vibrational properties of AlGaN/AlN/GaN heterostructures were studied using Raman scattering spectroscopy at room temperature. 532 nm (2.33 eV) was used as the excitations in the Raman scattering measurement. The effective mass obtained from the Raman scattering spectroscopy is in good agreement with the current results in the literature.en_US
dc.language.isoengen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectElectron Effective Massen_US
dc.subjectGan Heterostructureen_US
dc.subjectPhonon-Plasmon Coupled-Modeen_US
dc.subjectRaman Spectraen_US
dc.titleDetermination of the electron effective mass of 2D electrons in AlGaN/AlN/GaN heterostructure by Ramanscattering measurementsen_US
dc.typearticleen_US
dc.relation.journalJournal of Optoelectronics and Advanced Materialsen_US
dc.contributor.departmentAnadolu Üniversitesi, Fen Fakültesi, Fizik Bölümüen_US
dc.identifier.volume14en_US
dc.identifier.issue9.Ekien_US
dc.identifier.startpage787en_US
dc.identifier.endpage791en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.contributor.institutionauthorTıraş, Engin


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