Yayıncı "Natl Inst Optoelectronics" Fen Fakültesi için listeleme
Toplam kayıt 11, listelenen: 1-11
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Carbon synthesis in methane plasma
(Natl Inst Optoelectronics, 2007)In this paper, we report a new method to generate amorphous carbon. The growth of amorphous carbons was performed at atmospheric pressure using a high voltage pulsed power supply (20 kV and 25 kHz) under the methane flux. ... -
CdO:Al films deposited by sol-gel process: a study on their structural and optical properties
(Natl Inst Optoelectronics, 2009)Undoped and Al-doped CdO films have been prepared by sol-gel spin-coating method. Effects of Al dopant on the structural and optical properties of CdO film have been investigated. The films were prepared for Al/Cd ratios ... -
Complementary and alternative technique for the determination of electron effective mass: quantum Hall effect
(Natl Inst Optoelectronics, 2016)The quantum Hall effect measurements in the AlInN/AlN/GaN heterostructure are studied in the temperature range from 1.8 K to 14 K and a magnetic field up to 11 T. The quantized two-dimensional electron gas was placed at ... -
Determination of the electron effective mass of 2D electrons in AlGaN/AlN/GaN heterostructure by Raman-scattering measurements
(Natl Inst Optoelectronics, 2012)The electron effective mass in AlGaN/AlN/GaN heterostructure grown by the metalorganic chemical vapor deposition (MOCVD) technique was determined from the phonon-plasmon coupled-mode line-shape analysis of vibrational ... -
The determination of the optical band and optical constants of non-crystalline and crystalline ZnO thin films deposited by spray pyrolysis
(Natl Inst Optoelectronics, 2007)The optical constants and optical band gaps of the non-crystalline and crystalline zinc oxide (ZnO) thin films deposited by the spray pyrolysis method onto glass substrates at the different deposition times have been ... -
The determination of the thickness and optical constants of the ZnO crystalline thin film by using envelope method
(Natl Inst Optoelectronics, 2006)ZnO crystalline thin film has been deposited onto glass substrates by the spray pyrolysis method. The crystallographic structure of the film and the size of the crystallites in the film were studied by X-ray diffraction. ... -
The effect of deposition parameters on the physical properties of CdxZn1-xS films deposited by spray pyrolysis method
(Natl Inst Optoelectronics, 2007)The spray pyrolysis method for the deposition of thin solid films is a good method for the preparation of thin films suitable for scientific studies and for many applications in technology and industry. This method was ... -
Electrical characterization of ZnO/organic semiconductor diode
(Natl Inst Optoelectronics, 2008)The electrical characterization of IZO/FSS/Al diode has been investigated current-voltage method. The ideality factor of the diode was found to be 2.84, which confirm that the IZO/FSS/Al device indicates a non-ideal I-V ... -
Influence of the indium incorporation on the structural and electrical properties of zinc oxide films
(Natl Inst Optoelectronics, 2006)Undoped and indium-doped ZnO films have been deposited onto glass substrates by the spray pyrolysis method. The effect of indium incorporation on structural and electrical properties of ZnO films has been investigated. ... -
Polycrystalline indium-doped ZnO thin films: preparation and characterization
(Natl Inst Optoelectronics, 2008)Zinc oxide (ZnO) and indium-doped zinc oxide (20) thin films have been deposited onto glass substrates by the spray pyrolysis method. The variations of the structural, electrical and optical properties with the indium ... -
Preparation and characterization of ZnO thin films deposited by sol-gel spin coating method
(Natl Inst Optoelectronics, 2008)ZnO thin films have been deposited onto the glass substrates by the sol-gel spin coating method at different chuck rotation rates. This method was used for the preparation of thin films of the important semiconductors H-VI. ...