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dc.contributor.authorGerek, Ömer Nezih
dc.contributor.authorEce, D. Gökhan
dc.contributor.authorBarkana, Atalay
dc.date.accessioned2019-10-21T20:11:54Z
dc.date.available2019-10-21T20:11:54Z
dc.date.issued2007
dc.identifier.isbn978-1-4244-0588-6
dc.identifier.issn1091-5281
dc.identifier.urihttps://hdl.handle.net/11421/20353
dc.description24th IEEE Instrumentation and Measurement Technology Conference -- MAY 01-03, 2007 -- Warsaw, POLANDen_US
dc.descriptionWOS: 000251296800036en_US
dc.description.abstractSelection of useful and appropriate identifiers plays an important role in most detection and classification problems including the analysis of voltage waveform for power quality (PQ). In this case, the identifiers are extracted from the acquired voltage waveform. Using such identifiers, several classification algorithms may be applied in order to classify the event type. Statistical, spectral, or directly time domain data can be used as signature identifiers of the voltage waveform. In this work, a method is proposed to select a better set of feature vector elements that are more suitable for classification of PQ events, among a larger set of feature vector elements obtained from numerous methods. For this purpose, a novel covariance based common vector approach (CVA) is proposed. This approach enables a successful PQ event classification, and, at the same time, provides critical information about which of the identifiers within the parameter vector space are more efficient in the classification process. By retaining the more efficient parameters and discarding the rather useless ones, the obtained feature set is small in dimension and efficient in classification.en_US
dc.description.sponsorshipIEEEen_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.relation.ispartofseriesIEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, PROCEEDINGS
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.titleVoltage waveform pattern selection for power quality event classificationen_US
dc.typeconferenceObjecten_US
dc.relation.journal2007 IEEE Instrumentation & Measurement Technology Conference, Vols 1-5en_US
dc.contributor.departmentAnadolu Üniversitesi, Mühendislik Fakültesi, Elektrik ve Elektronik Mühendisliği Bölümüen_US
dc.identifier.startpage180en_US
dc.identifier.endpage184en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.contributor.institutionauthorGerek, Ömer Nezih
dc.contributor.institutionauthorBarkana, Atalay


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