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dc.contributor.authorÇakır, Deniz
dc.contributor.authorSevik, Cem
dc.contributor.authorPeeters, Francois M.
dc.date.accessioned2019-10-21T21:12:32Z
dc.date.available2019-10-21T21:12:32Z
dc.date.issued2014
dc.identifier.issn2050-7526
dc.identifier.issn2050-7534
dc.identifier.urihttps://dx.doi.org/10.1039/c4tc01794c
dc.identifier.urihttps://hdl.handle.net/11421/21399
dc.descriptionWOS: 000344998700007en_US
dc.description.abstractMetallic contacts are critical components of electronic devices and the presence of a large Schottky barrier is detrimental for an optimal device operation. Here, we show by using first-principles calculations that a self-assembled monolayer (SAM) of polar molecules between the metal electrode and MoSe2 monolayer is able to convert the Schottky contact into an almost Ohmic contact. We choose -CH3 and -CF3 terminated short-chain alkylthiolate (i.e. SCH3 and fluorinated alkylthiolates (SCF3)) based SAMs to test our approach. We consider both high (Au) and low (Sc) work function metals in order to thoroughly elucidate the role of the metal work function. In the case of Sc, the Fermi level even moves into the conduction band of the MoSe2 monolayer upon SAM insertion between the metal surface and the MoSe2 monolayer, and hence possibly switches the contact type from Schottky to Ohmic. The usual Fermi level pinning at the metal-transition metal dichalcogenide (TMD) contact is shown to be completely removed upon the deposition of a SAM. Systematic analysis indicates that the work function of the metal surface and the energy level alignment between the metal electrode and the TMD monolayer can be tuned significantly by using SAMs as a buffer layer. These results clearly indicate the vast potential of the proposed interface engineering to modify the physical and chemical properties of MoSe2.en_US
dc.description.sponsorshipFlemish Science Foundation (FWO-VI); Methusalem foundation of the Flemish Government; FWO Pegasus-short Marie Curie Fellowship; Scientific and Technological Research Council of Turkey [TUBITAK 113F096]; Anadolu University [BAP-1306F281, BAP-1404F158]; Turkish Academy of Science (TUBA)en_US
dc.description.sponsorshipPart of this work is supported by the Flemish Science Foundation (FWO-VI) and the Methusalem foundation of the Flemish Government. Computational resources were provided by TUBITAK ULAKBIM, High Performance and Grid Computing Center (TR-Grid e-Infrastructure). D. C. is supported by a FWO Pegasus-short Marie Curie Fellowship. C. S. acknowledges the support from Scientific and Technological Research Council of Turkey (TUBITAK 113F096), Anadolu University (BAP-1306F281, -1404F158) and Turkish Academy of Science (TUBA).en_US
dc.language.isoengen_US
dc.publisherRoyal Soc Chemistryen_US
dc.relation.isversionof10.1039/c4tc01794cen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.titleEngineering electronic properties of metal-MoSe2 interfaces using self-assembled monolayersen_US
dc.typearticleen_US
dc.relation.journalJournal of Materials Chemistry Cen_US
dc.contributor.departmentAnadolu Üniversitesi, Mühendislik Fakültesi, Makine Mühendisliği Bölümüen_US
dc.identifier.volume2en_US
dc.identifier.issue46en_US
dc.identifier.startpage9842en_US
dc.identifier.endpage9849en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.contributor.institutionauthorSevik, Cem


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