Advanced Search

Show simple item record

dc.contributor.authorPalizdar, Meghdad
dc.contributor.authorMallick, Dhiman
dc.contributor.authorMaity, Tuhin
dc.contributor.authorRoy, Saibal
dc.contributor.authorComyn, Tim P.
dc.contributor.authorStevenson, Tim J.
dc.contributor.authorBell, Andrew J.
dc.date.accessioned2019-10-22T16:58:48Z
dc.date.available2019-10-22T16:58:48Z
dc.date.issued2014
dc.identifier.isbn978-1-4799-3860-5
dc.identifier.urihttps://hdl.handle.net/11421/21627
dc.identifier.urihttps://dx.doi.org/10.1109/ISAF.2014.6922999en_US
dc.descriptionIEEE Joint Int Symp on the Applications of Ferroelectrics / Int Workshop on Acoustic Transduction Materials and Devices / Workshop on Piezoresponse Force Microscopy -- MAY 12-16, 2014 -- PAen_US
dc.descriptionWOS: 000363973100043en_US
dc.description.abstractThe template grain growth technique was used to synthesis textured 60BiFeO(3)-PbTiO3 (60:40BFPT) by using platelets of BaTiO3 as template. Synchrotron measurement clearly showed textured 60:40BFPT. Moreover, in situ high energy synchrotron radiation was employed to investigate the influence of an external electric filed on crystallographic structure of mixed phase 60:40BFPT. Application of an electric field >= 1 kV/mm resulted in phase transformation from mixed rhombohedral/tetragonal phases (approximate to 73.5% tetragonal / 26.5% rhombohedral) to predominately tetragonal phase (approximate to 95%) at applied field of 6 kV/mm. A crystallographic texture refinement was done by using software package materials analysis using diffraction (MAUD) with a 4th order spherical harmonic orientation distribution function (ODF). This refinement was completed using a P4mm+Cm structure model. Texture coefficients were constrained such that the equivalent texture coefficients of each phase are the same. The resulting texture refinement determined that sample has a 1.3 multiples of random distribution (MRD) {100} crystallographic texture.en_US
dc.description.sponsorshipIEEEen_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.relation.isversionof10.1109/ISAF.2014.6922999en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectTextureen_US
dc.subjectSynchrotronen_US
dc.subjectPhase Transformatioen_US
dc.subjectRefinmenten_US
dc.titleTexture analysis of thick bismuth ferrite lead titanate layersen_US
dc.typeconferenceObjecten_US
dc.relation.journal2014 Joint IEEE International Symposium On the Applications of Ferroelectrics, International Workshop On Acoustic Transduction Materials and Devices & Workshop On Piezoresponse Force Microscopy (Isaf/Iwatmd/Pfm)en_US
dc.contributor.departmentAnadolu Üniversitesi, Mühendislik Fakültesi, Malzeme Bilimi ve Mühendisliği Bölümüen_US
dc.identifier.startpage166en_US
dc.identifier.endpage168en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record