Browsing Enstitüler by Subject "X-Ray Methods"
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Investigation of the phase composition and stability of the alpha-SiAlONs by the Rietveld method
(Elsevier Sci LTD, 2002)Different compositions of Y- and Nd-alpha-SiAlONs were sintered at 1825 degreesC and analysed by the XRD method. The Rietveld technique was used for characterisation of the diffraction pattern and the x value of alpha-SiAlON, ...