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dc.contributor.authorTuran, Servet
dc.contributor.authorKnowles, K. M.
dc.contributor.editorRodenburg, JM
dc.date.accessioned2019-10-19T21:04:09Z
dc.date.available2019-10-19T21:04:09Z
dc.date.issued1997
dc.identifier.isbn0-7503-0441-3
dc.identifier.issn0951-3248
dc.identifier.urihttps://hdl.handle.net/11421/15754
dc.description1997 Biennial Meeting of the Electron-Microscopy-and-Analysis-Group of the Institute-of-Physics (EMAG 97) -- SEP 02-05, 1997 -- UNIV CAMBRIDGE, CAVENDISH LAB, CAMBRIDGE, ENGLANDen_US
dc.descriptionWOS: 000071919200114en_US
dc.description.abstractTheoretical considerations of the Hamaker constant for the interaction of two media across a third suggest that the highly anisotropic nature of the refractive indices of a medium such as h-BN will produce an orientation dependence on equilibrium film thickness through their effect on the dominant dispersion energy term in the Hamaker constant. High resolution transmission electron microscope observations of h-BN - 3C SiC interphase boundaries confirm the expected trend in orientation dependence on equilibrium film thickness.en_US
dc.description.sponsorshipInst Phys, Electron Microscopy & Anal Grpen_US
dc.language.isoengen_US
dc.publisherIOP Publishing LTDen_US
dc.relation.ispartofseriesINSTITUTE OF PHYSICS CONFERENCE SERIES
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.titleOrientation-dependent equilibrium film thickness at interphase boundaries in ceramic-ceramic compositesen_US
dc.typeconferenceObjecten_US
dc.relation.journalElectron Microscopy and Analysis 1997en_US
dc.contributor.departmentAnadolu Üniversitesi, Fen Bilimleri Enstitüsü, Seramik Mühendisliği Anabilim Dalıen_US
dc.identifier.issue153en_US
dc.identifier.startpage483en_US
dc.identifier.endpage486en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US]
dc.contributor.institutionauthorTuran, Servet


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