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dc.contributor.authorTuran, Servet
dc.contributor.authorKnowles, K. M.
dc.date.accessioned2019-10-19T21:04:11Z
dc.date.available2019-10-19T21:04:11Z
dc.date.issued1997
dc.identifier.issn0955-2219
dc.identifier.urihttps://dx.doi.org/10.1016/S0955-2219(97)00070-8
dc.identifier.urihttps://hdl.handle.net/11421/15762
dc.descriptionInternational Symposium on Nitrides (JENI 10) -- MAY 29-31, 1996 -- RENNES, FRANCEen_US
dc.descriptionWOS: 000071503300015en_US
dc.description.abstractInterphase boundaries between hexagonal boron nitride and beta-Si3N4 in hot isostatically pressed Si3N4-SiC particulate composites, in which boron nitride appears as a trace contaminant, have been examined using high resolution transmission electron microscopy. A number of characteristic orientation relationships were observed between these two phases. Significantly, high resolution transmission electron microscopy showed that the interphase boundaries tended not to contain any intergranular filmsen_US
dc.language.isoengen_US
dc.publisherElsevier Sci LTDen_US
dc.relation.isversionof10.1016/S0955-2219(97)00070-8en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.titleInterphase boundaries between hexagonal boron nitride and beta silicon nitride in silicon nitride silicon carbide particulate compositesen_US
dc.typeconferenceObjecten_US
dc.relation.journalJournal of the European Ceramic Societyen_US
dc.contributor.departmentAnadolu Üniversitesi, Fen Bilimleri Enstitüsü, Seramik Mühendisliği Anabilim Dalıen_US
dc.identifier.volume17en_US
dc.identifier.issue15-16en_US
dc.identifier.startpage1849en_US
dc.identifier.endpage1854en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US]
dc.contributor.institutionauthorTuran, Servet


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